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</style><table class="sidebar nomobile nowraplinks"><tbody><tr><td class="sidebar-pretitle">Part of a series of articles on</td></tr><tr><th class="sidebar-title-with-pretitle"><a href="Machine_industry" title="Machine industry">Machine industry</a></th></tr><tr><td class="sidebar-image"><span typeof="mw:File"></span></td></tr><tr><th class="sidebar-heading">
Manufacturing methods</th></tr><tr><td class="sidebar-content hlist">
<ul><li><a href="Batch_production" title="Batch production">Batch production</a></li>
<li><a href="Job_production" title="Job production">Job production</a></li>
<li><a href="Mass_production" title="Mass production">Flow production</a></li>
<li><a href="Lean_manufacturing" title="Lean manufacturing">Lean manufacturing</a></li>
<li><a href="Agile_manufacturing" title="Agile manufacturing">Agile manufacturing</a></li></ul></td>
</tr><tr><th class="sidebar-heading">
Industrial technologies</th></tr><tr><td class="sidebar-content hlist">
<ul><li><a href="Product_lifecycle" title="Product lifecycle">PLM</a></li>
<li><a href="Reliability-centered_maintenance" title="Reliability-centered maintenance">RCM</a></li>
<li><a href="Total_productive_maintenance" title="Total productive maintenance">TPM</a></li>
<li><a href="Value-driven_maintenance" title="Value-driven maintenance">VDM</a></li>
<li><a href="Quick_response_manufacturing" title="Quick response manufacturing">QRM</a></li>
<li><a href="Theory_of_constraints" title="Theory of constraints">TOC</a></li>
<li><a href="Six_Sigma" title="Six Sigma">Six Sigma</a></li>
<li><a href="Overall_Equipment_Effectiveness" class="mw-redirect" title="Overall Equipment Effectiveness">OEE</a></li>
<li><a href="Total_quality_management" title="Total quality management">TQM</a></li>
<li><a href="Zero_Defects" title="Zero Defects">ZD</a></li></ul></td>
</tr><tr><th class="sidebar-heading">
Information and communication</th></tr><tr><td class="sidebar-content hlist">
<ul><li><a href="ISA-88" title="ISA-88">ISA-88</a></li>
<li><a href="ANSI/ISA-95" title="ANSI/ISA-95">ISA-95</a></li>
<li><a href="Enterprise_resource_planning" title="Enterprise resource planning">ERP</a></li>
<li><a href="IEC_62264" title="IEC 62264">IEC 62264</a></li>
<li>B2MML</li></ul></td>
</tr><tr><th class="sidebar-heading">
Process control</th></tr><tr><td class="sidebar-content hlist">
<ul><li><a href="Programmable_logic_controller" title="Programmable logic controller">PLC</a></li>
<li><a href="Distributed_control_system" title="Distributed control system">DCS</a></li>
<li><a href="SCADA" title="SCADA">SCADA</a></li></ul></td>
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<p><b>Process window index</b> (<b>PWI</b>) is a <a href="Statistical_measure" class="mw-redirect" title="Statistical measure">statistical measure</a> that quantifies the robustness of a manufacturing process, e.g. one which involves heating and cooling, known as a thermal process. In manufacturing industry, PWI values are used to calibrate the heating and cooling of soldering jobs (known as a thermal profile) while baked in a <a href="Reflow_oven" title="Reflow oven">reflow oven</a>.
</p><p>PWI measures how well a process fits into a user-defined process limit known as the specification limit. The specification limit is the tolerance allowed for the process and may be statistically determined. Industrially, these specification limits are known as the <i><a href="Process_window" title="Process window">process window</a></i>, and values that a plotted inside or outside this window are known as the process window index.
</p><p>Using PWI values, processes can be accurately measured, analyzed, compared, and tracked at the same level of <a href="Statistical_process_control" title="Statistical process control">statistical process control</a> and <a href="Quality_control" title="Quality control">quality control</a> available to other manufacturing processes.
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<div class="mw-heading mw-heading2"><h2 id="Statistical_process_control">Statistical process control</h2></div>
<p><a href="Process_capability" title="Process capability">Process capability</a> is the ability of a process to produce output within <a href="Specification_(technical_standard)" title="Specification (technical standard)">specified limits</a>.<sup id="cite_ref-nist_1-0" class="reference"><a href="#cite_note-nist-1"><span class="cite-bracket">[</span>1<span class="cite-bracket">]</span></a></sup> To help determine whether a manufacturing or business process is in a state of statistical control, process engineers use <a href="Control_chart" title="Control chart">control charts</a>, which help to predict the future performance of the process based on the current process.<sup id="cite_ref-juran_2-0" class="reference"><a href="#cite_note-juran-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup>
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<p>To help determine the capability of a process, statistically determined upper and lower limits are drawn on either side of a process <a href="Arithmetic_mean" title="Arithmetic mean">mean</a> on the control chart.<sup id="cite_ref-juran_2-1" class="reference"><a href="#cite_note-juran-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup> The control limits are set at three <a href="Standard_deviation" title="Standard deviation">standard deviations</a> on either side of the process mean, and are known as the upper control limit (UCL) and lower control limit (LCL) respectively.<sup id="cite_ref-juran_2-2" class="reference"><a href="#cite_note-juran-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup> If the process <a href="Data_plot" class="mw-redirect" title="Data plot">data plotted</a> on the control chart remains within the control limits over an extended period, then the process is said to be stable.<sup id="cite_ref-juran_2-3" class="reference"><a href="#cite_note-juran-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-pwi_3-0" class="reference"><a href="#cite_note-pwi-3"><span class="cite-bracket">[</span>3<span class="cite-bracket">]</span></a></sup>
</p><p>The tolerance values specified by the end-user are known as specification limits – the upper specification limit (USL) and lower specification limit (LSL).<sup id="cite_ref-juran_2-4" class="reference"><a href="#cite_note-juran-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup> If the process <a href="Data_plot" class="mw-redirect" title="Data plot">data plotted</a> on a control chart remains within these specification limits, then the process is considered a capable process, denoted by <span class="mwe-math-element mwe-math-element-inline"><span class="mwe-math-mathml-inline mwe-math-mathml-a11y" style="display: none;"><math xmlns="http://www.w3.org/1998/Math/MathML" alttext="{\displaystyle {\hat {C}}_{pk}}">
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</p><p>The manufacturing industry has developed customized specification limits known as <i>process windows</i>. Within this process window, values are plotted. The values relative to the process mean of the window are known as the <i>process window index</i>. By using PWI values, processes can be accurately measured, analyzed, compared, and tracked at the same level of <a href="Statistical_process_control" title="Statistical process control">statistical process control</a> and <a href="Quality_control" title="Quality control">quality control</a> available to other manufacturing processes.<sup id="cite_ref-pwi_3-2" class="reference"><a href="#cite_note-pwi-3"><span class="cite-bracket">[</span>3<span class="cite-bracket">]</span></a></sup>
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<div class="mw-heading mw-heading3"><h3 id="Control_limits">Control limits</h3></div>
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<p><i>Control limits</i>, also known as <i>natural process limits</i>, are horizontal lines drawn on a <a href="Statistical_process_control" title="Statistical process control">statistical process</a> <a href="Control_chart" title="Control chart">control chart</a>, usually at a distance of ±3 <a href="Standard_deviation" title="Standard deviation">standard deviations</a> of the plotted <a href="Statistic" title="Statistic">statistic's</a> <a href="Mean" title="Mean">mean</a>, used to judge the stability of a process.<sup id="cite_ref-4" class="reference"><a href="#cite_note-4"><span class="cite-bracket">[</span>4<span class="cite-bracket">]</span></a></sup>
</p><p>Control limits should not be confused with <i>tolerance limits</i> or <i>specifications,</i> which are completely independent of the <a href="Frequency_distribution" class="mw-redirect" title="Frequency distribution">distribution</a> of the plotted sample statistic. Control limits describe what a process is capable of producing (sometimes referred to as the "voice of the process"), while tolerances and specifications describe how the product should perform to meet the customer's expectations (referred to as the "voice of the customer").
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<div class="mw-heading mw-heading4"><h4 id="Use">Use</h4></div>
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</style><div role="note" class="hatnote navigation-not-searchable">See also: <a href="Control_chart" title="Control chart">Control chart</a></div>
<p>Control limits are used to detect signals in process data that indicate that a process is not in control and, therefore, not operating predictably. A value in excess of the control limit indicates a special cause is affecting the process.
</p><p>To detect signals one of several rule sets may be used (<a href="Control_chart#Rules_for_detecting_signals" title="Control chart">Control chart §&nbsp;Rules for detecting signals</a>). One specification outlines that a signal is defined as any single point outside of the control limits. A process is also considered out of control if there are seven consecutive points, still inside the control limits but on one single side of the mean.
</p><p>For <a href="Normal_distribution" title="Normal distribution">normally distributed</a> statistics, the area bracketed by the control limits will on average contain 99.73% of all the plot points on the chart, as long as the process is and remains in statistical control. A false-detection rate of at least 0.27% is therefore expected.
</p><p>It is often not known whether a particular process generates data that conform to particular distributions, but the <a href="Chebyshev's_inequality" title="Chebyshev's inequality">Chebyshev's inequality</a> and the <a href="Vysochanskij%E2%80%93Petunin_inequality" title="Vysochanskij–Petunin inequality">Vysochanskij–Petunin inequality</a> allow the inference that for any <a href="Unimodal" class="mw-redirect" title="Unimodal">unimodal</a> distribution at least 95% of the data will be encapsulated by limits placed at 3 sigma.
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<div class="mw-heading mw-heading2"><h2 id="PWI_in_electronics_manufacturing">PWI in electronics manufacturing</h2></div>
<div role="note" class="hatnote navigation-not-searchable">Main article: <a href="Reflow_soldering" title="Reflow soldering">Reflow soldering</a></div>

<p>An example of a process to which the PWI concept may be applied is <a href="Soldering" title="Soldering">soldering</a>. In soldering, a thermal profile is the set of time-temperature values for a <a href="Reflow_soldering" title="Reflow soldering">variety of processes</a> such as slope, thermal soak, reflow, and peak.<sup id="cite_ref-lead_5-0" class="reference"><a href="#cite_note-lead-5"><span class="cite-bracket">[</span>5<span class="cite-bracket">]</span></a></sup>
</p><p>Each thermal profile is ranked on how it fits in a process window (the specification or tolerance limit).<sup id="cite_ref-KIC_6-0" class="reference"><a href="#cite_note-KIC-6"><span class="cite-bracket">[</span>6<span class="cite-bracket">]</span></a></sup> Raw temperature values are normalized in terms of a percentage relative to both the process mean and the window limits. The center of the process window is defined as zero, and the extreme edges of the process window are ±99%.<sup id="cite_ref-KIC_6-1" class="reference"><a href="#cite_note-KIC-6"><span class="cite-bracket">[</span>6<span class="cite-bracket">]</span></a></sup> A PWI greater than or equal to 100% indicates that the profile does not process the product within specification. A PWI of 99% indicates that the profile runs at the edge of the process window.<sup id="cite_ref-KIC_6-2" class="reference"><a href="#cite_note-KIC-6"><span class="cite-bracket">[</span>6<span class="cite-bracket">]</span></a></sup> For example, if the process mean is set at 200&nbsp;°C, with the process window calibrated at 180&nbsp;°C and 220&nbsp;°C respectively; then a measured value of 188&nbsp;°C translates to a process window index of −60%. A lower PWI value indicates a more robust profile.<sup id="cite_ref-lead_5-1" class="reference"><a href="#cite_note-lead-5"><span class="cite-bracket">[</span>5<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-KIC_6-3" class="reference"><a href="#cite_note-KIC-6"><span class="cite-bracket">[</span>6<span class="cite-bracket">]</span></a></sup> For maximum efficiency, separate PWI values are computed for peak, slope, reflow, and soak processes of a thermal profile.
</p><p>To avoid <a href="Thermal_shock" title="Thermal shock">thermal shock</a> affecting production, the steepest slope in the thermal profile is determined and leveled. Manufacturers use custom-built software to accurately determine and decrease the steepness of the slope. In addition, the software also automatically recalibrates the PWI values for the peak, slope, reflow, and soak processes. By setting PWI values, engineers can ensure that the reflow soldering work does not overheat or cool too quickly.<sup id="cite_ref-lead_5-2" class="reference"><a href="#cite_note-lead-5"><span class="cite-bracket">[</span>5<span class="cite-bracket">]</span></a></sup>
</p>
<div class="mw-heading mw-heading2"><h2 id="Formula">Formula</h2></div>

<p>The PWI is calculated as the worst case (i.e. highest number) in the set of thermal profile data. For each profile statistic the percentage used of the respective process window is calculated, and the worst case (i.e. highest percentage) is the PWI.
</p><p>For example, a thermal profile with three <a href="Thermocouple" title="Thermocouple">thermocouples</a>, with four profile statistics logged for each thermocouple, would have a set of twelve statistics for that thermal profile. In this case, the PWI would be the highest value among the twelve percentages of the respective process windows.
</p><p>The formula to calculate PWI is:<sup id="cite_ref-SMT_7-0" class="reference"><a href="#cite_note-SMT-7"><span class="cite-bracket">[</span>7<span class="cite-bracket">]</span></a></sup>
</p>
<dl><dd><span class="mwe-math-element mwe-math-element-inline"><span class="mwe-math-mathml-inline mwe-math-mathml-a11y" style="display: none;"><math xmlns="http://www.w3.org/1998/Math/MathML" alttext="{\displaystyle {\text{PWI}}=100\times \max _{i=1\dots N \atop j=1\dots M}\left\{\left|{\frac {{\text{measured value}}_{[i,j]}-{\text{average limits}}_{[i,j]}}{{\text{range}}_{[i,j]}/2}}\right|\right\}}">
<semantics>
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<mtext>PWI</mtext>
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<mn>100</mn>
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<mtext>measured value</mtext>
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<mtext>average limits</mtext>
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<annotation encoding="application/x-tex">{\displaystyle {\text{PWI}}=100\times \max _{i=1\dots N \atop j=1\dots M}\left\{\left|{\frac {{\text{measured value}}_{[i,j]}-{\text{average limits}}_{[i,j]}}{{\text{range}}_{[i,j]}/2}}\right|\right\}}</annotation>
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</math></span><img src="./b52d18af2bdb9154fa92b6dca5617e14f70a6b11.svg" class="mwe-math-fallback-image-inline mw-invert skin-invert" aria-hidden="true" style="vertical-align: -3.505ex; width:64.305ex; height:7.843ex;" alt="{\displaystyle {\text{PWI}}=100\times \max _{i=1\dots N \atop j=1\dots M}\left\{\left|{\frac {{\text{measured value}}_{[i,j]}-{\text{average limits}}_{[i,j]}}{{\text{range}}_{[i,j]}/2}}\right|\right\}}" loading="lazy"></span></dd></dl>
<p>where:<sup id="cite_ref-SMT_7-1" class="reference"><a href="#cite_note-SMT-7"><span class="cite-bracket">[</span>7<span class="cite-bracket">]</span></a></sup>
</p>
<dl><dd><i>i</i> = 1 to <i>N</i> (number of thermocouples)</dd>
<dd><i>j</i> = 1 to <i>M</i> (number of statistics per thermocouple)</dd>
<dd>measured value [<i>i</i>,&nbsp;<i>j</i>] = the [<i>i</i>,&nbsp;<i>j</i>]<sup>th</sup> statistic's measured value</dd>
<dd>average limits [<i>i</i>,&nbsp;<i>j</i>] = the average of the high and low (specified) limits of the [<i>i</i>,&nbsp;<i>j'</i>]<sup>th</sup> statistic</dd>
<dd>range [<i>i</i>,&nbsp;<i>j</i>] = the high limit minus the low limit of the [<i>i</i>,&nbsp;<i>j</i>]<sup>th</sup> statistic</dd></dl>
<div class="mw-heading mw-heading2"><h2 id="See_also">See also</h2></div>
<ul><li><a href="Acceptable_quality_limit" title="Acceptable quality limit">Acceptable quality limit</a></li>
<li><a href="Control_chart#Chart_details" title="Control chart">Control chart §&nbsp;Chart details</a></li>
<li><a href="Reflow_soldering" title="Reflow soldering">Reflow soldering</a></li>
<li><a href="Wave_soldering" title="Wave soldering">Wave soldering</a></li></ul>
<div class="mw-heading mw-heading2"><h2 id="References">References</h2></div>
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